QIF-T0050
highHardware fault injection (voltage/EM glitching)
Tier 3 — Demonstrated (Lab-proven)
Legacy status: DEMONSTRATED
Physical attack using voltage glitches, clock manipulation, or electromagnetic pulses to induce faults in BCI processor. Can bypass security checks, extract cryptographic keys, or cause unpredictable stimulation behavior. Requires physical proximity to device.
Technique Details
- Tactic
- QIF-B.IN
- Status
- DEMONSTRATED
- Bands
- S1, S2
✚ Therapeutic Application
Inducing hardware faults via voltage glitching, EM pulse, or laser injection to bypass BCI security
Neural Impact
2 of 7 neural bands affected
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Scoring
NISS:1.1/BI:H/CR:L/CD:L/CV:N/RV:P/NP:N CVSS:4.0/AV:P/AC:H/AT:P/PR:N/UI:N/VC:L/VI:H/VA:H/SC:N/SI:L/SA:H Governance
Neurorights at Risk
This technique threatens 2 of the 4 proposed neurorights (Ienca & Andorno, 2017).
FDORA §3305 Compliance
- ! CVSS cannot express neural-specific impacts
Population Vulnerability
CRB vulnerability adjustment (γ=0.30) accounts for age, diagnosis severity, consent capacity, and device dependency.
| Population | NISS Base | Adjusted | Severity | Delta |
|---|---|---|---|---|
| Adult (Default) | 3.4 | 3.4 | Low | - |
| Child (10yr) + ADHD | 3.4 | 4.0 | Low | +0.60 |
| Adult with ALS | 3.4 | 3.9 | Low | +0.55 |
Validation Status
Theoretical / Not yet validated. This technique has not been independently tested. See the validation dashboard for what has been tested.